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WPH Probe
...x 12 square pin cable interface. The circuit board has been laid out such that both series and shunt components can be added to the signal path of each needle....
Pyramid-MW Data Sheet
For robust, lower cost and long-life production testing of 57 GHz to 81 GHz RFICs, FormFactor’s Pyramid-MW Probe is the world’s only mm-wave (mmW) RF production probe card that ensures...
InfinityQuad Tech Brief: Addressing the Challenges of Small Pad Probing
Smaller pads not only utilize less device real estate space, they also allow sacrificial test structures to be placed in scribe lines, meaning process control monitoring and device characterization can...
InfinityQuad Probe: N+1-port SOLT/SOLR calibration
The calibration solution presented in this document is focused on calibration of InfinityQuad™ probes, where the probes are assumed in all four quadrants of the device under test (DUT).
How InfinityQuadâ„¢ Probes Help DICE Characterize Mixed-Signal Devices with Small Pads
...size of the pads to 80 μm x 80 μm. Read our case study and learn how DICE overcame testing challenges and reduced test times by 50% using InfinityQuad probes....
Velox Probe Station Control Software Brochure
Learn how Velox delivers a comprehensive and systematic means of achieving the highest levels of performance and accuracy in virtually any engineering test environment.
PA300 Data Sheet
The PA300 is a precise and flexible semi-automatic test solution for wafers and substrates up to 300 mm. It is ideal for failure analysis (FA), device characterization and modeling from...
Thermal System L40/M40 Facility Planning Guide (-55°C to +200°C)
This guide contains information to help prepare your facility for the arrival of your ATT Test Systems L40/M40 thermal system.
T300 Data Sheet
...of -55° to 300°C. In combination with FormFactor’s patented Microchamber, the T300 features a state-of-the-art chuck to ensure low-contact resistance, while providing a low-noise, fully guarded and shielded test environment....
WinCal Data Sheet
...from FormFactor is a comprehensive and intuitive on-wafer RF measurement calibration tool to achieve accurate and repeatable S-parameter measurement, which is crucial for precision device modeling/characterization and engineering RFIC test....
Pressure Probe Module Data Sheet
The Pressure Probe Module Pressure Probe Module is the ideal solution for testing absolute and relative/differential pressure sensors at wafer level that work based on the piezoresistive or capacitive principle....
Educational Savings Program
FormFactor offers an Educational Savings Program that puts the industry's best wafer test technology within reach of departmental budgets....
SiP/SoC P-Series Pyramid Probe Card Data Sheet
Advanced logic (SiP/SoC) production probe card solutions reduce the cost of test through enhanced throughput, reduced maintenance and increased yields; enabled through large multi-DUT probe surfaces, permanent probe alignment, superior...
Probing 25 μm-diameter Micro-bumps for Wide-I/O 3D SICs
Direct micro-bump probing is proving to be a more cost-effective and technologically complete method than dedicated prebond probe pads. However, it requires advanced probe cards and probe stations. Recent work...
Autonomous SiPh Measurements Brief
...applications such as automotive LIDAR, are likely to follow. The key to making successful measurements on silicon photonic devices is the integration of probe, positioning and test and measurement technologies....