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Products

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High Performance Probe Systems

Elite 300 Wafer Probing Station

Whether you need a cost-effective manual station for probing 150mm wafers or a semiautomatic thermal station to probe 200mm or 300mm wafers, Cascade Microtech offers a complete line of high-performance solutions for on-wafer probing, circuit boards and modules, vertical probe cards, MEMS, electro-optic devices and more. Probe stations are available with accessories such as thermal control systems, special cables, calibration software, and industry-leading probes. [View more]

Reliability Test Products

1164 Reliability Test System

The Model 1164 Reliability Test System offers a single test platform that provides true parallel testing for all semiconductor reliability applications. The Test System consists of individual Application Modules each paired with an individual Notebook Oven. Application Modules operate completely autonomously from each other. [View more]

Probes

Infinity Probe

Cascade Microtech offers more than 50 different analytical probe models for wafer, package, and board level characterization. We offer RF, microwave and millimeter-wave probes in the Infinity Probe®, Air Coplanar Probe and |Z| Probe® families, as well as probes for DC parametric test and failure analysis. [View more]

Probe Cards

Pyramid Probes

Pyramid Probe cards are rugged, robust, and well suited for the rigors of high-performance production wafer sort. Its industry-leading signal integrity and mechanical alignment capabilities make these probe cards the perfect fit for multi-die testing for RF wireless, high-speed digital in SiPs, SoCs, and leading edge DC parametric testing. [View more]