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Three Benefits of the Estrada WLR Test System
The Estrada turnkey wafer-level reliability (WLR) test system provides a smooth pathway toward accelerated reliability assessments and process qualifications on 300 mm wafer processes. This comprehensive WLR test cell is...
New Automated Cryogenic Wafer Probe System to Enable Superconducting Compute Applications
...leading edge in developing superconducting technologies including a Reciprocal Quantum Logic (RQL) processor, which delivers exponential improvements in computing power and reduction in energy consumption compared to traditional CMOS processors....
New On Demand Webinar – Next Generation DC Probes for Device Modelling
...for device modeling. Connor works out of our Boulder, CO cryogenic lab. His main function is to help customers to solve their testing problem through configuration of products or test...
FormFactor Earns Top VLSIresearch Honors
...at 8.9% CAGR, where FormFactor achieved a commanding market share of 40%. VLSIresearch described this upward trend as driven by migration to higher parallelism testing to reduce test cost, and...
Pyramid Accel Data Sheet
Addressing the increasingly complex test challenges brought on by today’s SoC and RF devices, FormFactor’s Pyramid Accel debug fixture provides a unique and innovative approach for accelerating the development of...
eVue III Data Sheet
The eVue digital imaging system is the original digital imaging system optimized for on-wafer test with FormFactor’s probe stations. The revolutionary multi-optical path, multi-camera design of eVue offers the perfect...
Ultra High Temperature Probe Card Solution for Automotive IC Testing
In this paper, we discuss overall industry trend of automotive IC growth and technology trends, wafer test challenges and FromFactor’s solution to enable massive parallel testing of >=128 DUT parallel...
The Digital Revolution: NRZ to PAM4
...presentation, Daniel Bock and David Raschko will show some of the impacts of NRZ compared to PAM4 on wafer test through example probe cards and describe the changing test requirements....
2022 SWTest Award Winning Presentations – Congratulations!
...communication infrastructure operates over fiber, and is using PAM4 modulation, moving from 28 Gbps to 56 Gbps (and beyond). For wafer test, this translates to test requirements at very high...
Considerations for Vertical High Probe Count Testing
Presented at SWTest 2023 As semiconductor suppliers strive to increase their throughput and lower their test costs, probe card parallelism continues to increase. State of the art probe card designs...
Five Reasons Constant Voltage EM (CVEM) Replaces CIEM for IC Failure Capture – Part One
Constant Current Electromigration (CIEM) is coming under fire as a new interconnect reliability test methodology – Constant Voltage Electromigration (CVEM) – begins to take root. Many (including FormFactor) are seeing...
Introducing the Altius Vertical MEMS Probe Card for Advanced Packaging Technologies
...probe at operating overtravel with best-in-class contact resistance stability Support for HBM known-good-die or known-good-stack test, >= 3 Gbps test speed Scalable for multi-site test to increase throughput, X4 capable...
Production Test RF Calibration for Multi-DUT Probe Cards: How to Get the Most Accurate Measurements
...many companies are moving to multi-DUT test to increase number of wafers tested per probe card and to increase speed of test with lower number of index steps. Watch the...
5 Ways the EPS150RF and EPS200RF Probe Stations Deliver Accurate Measurement Results – Part One
...the device under test (DUT), repeated calibration and significant increases in test time. Moreover, unnecessary touchdowns on the calibration standards and DUT pads decrease the lifetime of the calibration substrate,...
OptoVue Pro – Enhanced Photonics Probing Calibration Now Available for the SUMMIT200 Probe Station
...calibrations to be performed in-situ without removing the test wafer to put a calibration wafer on the chuck. This CalVue feature enables seamless calibrations without operator interaction, resulting in faster...