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Pyramid-MW
For robust, lower cost and long-life production testing of 57 GHz to 81 GHz RFICs, FormFactor’s Pyramid-MW Probe is the world’s only mm-wave (mmW) RF production probe card that ensures...
Wafer-Level Electromigration – Reducing Cycle Time for Faster Feedback
...rising interconnect complexity of new nodes demands investigation of many materials and structure types in a compressed timeframe. This impels the industry to pursue methods of accelerating design and qualification...
Happy Holidays – Our Top 5 Blog Posts of 2019
...(compared to your cell phone as example) and face harsh environmental requirements that an automobile introduces. In addition, wafer test suppliers need to ramp up test coverage without driving up...
Current Carrying Capacity Maximization in Probe Cards and the Path to An Unburnable Probe
Data centers and High-Performance-Compute (HPC) applications are quickly approaching, and even exceeding, 1 kW of total power in a single chip under normal operating conditions. In addition to new applications,...
Transforming 300 mm Probing with Contact Intelligence Technology
...compensation of thermally-induced drift for each probe separately without compromising low-noise environment conditions. Contact Intelligence technology includes on-axis probe needle tracking capability to deliver accurate probe placement on pads as...
CM300xi-ULN Probe Station – Eliminating Deployment Issues by Picking the Ideal Location
...saving up six to ten weeks of wasted engineering time and two to three months of delayed product testing. And with high throughput testing automation capabilities, test labs and companies...
Overcoming 3 Challenges with 5G Production-Level Test
...requesting new test solutions with more mmWave channels than current off-the-shelf testers are capable of. Potentially expanding the SMU to support this would be a possible solution, it should also...
Wafer Prober: Characterization of MEMS Devices at Wafer-Level
...the final test of the packaged device. The company we are collaborating with compared both results and found that at room temperatures, the results of the on-wafer test and package...
At the Forefront of Testing New Advanced Packages
...technologies offer breakthrough enhancements in computing power and memory bandwidth to support important initiatives such as artificial intelligence, automotive, 5G/mobile, high performance computing and other high-end applications. Companies like Intel,...
EM PLR and EM WLR Data Prove Interchangeable
...a reliability test program compared to PLR: faster time to test results, reduced operating expense, and improved data integrity. With proper equipment capable of high test temperatures up to 350°C...
LED Test- Challenges for Equipment Manufacturers
As markets for display backlighting and solid-state lighting grow, equipment vendors adapt to meet the needs of a rapidly changing industry. New equipment must accommodate the range of test configurations...
5G mmWave: Multi-site RF Probe Cards Enable Lower Cost-of-test in Mass Production
...realize actual cost reduction, tester and probe card companies need to evolve quickly to support increased parallelism of mmWave testing. This session drills down into the RF test cell to...
Introducing Rapid Cooling Probe System for Quantum Device Testing
...roadblock and simultaneously enable parallel probe test. We’re excited to bring these new capabilities to the community, to fast-track quantum development. For more information, visit the website, and download the...
High-Voltage and High-Current Probing with Safety in Mind
...shortest time, with maximum confidence. Check out our EPS150TESLA product data sheet (PDF) to see how you can achieve accurate, repeatable, and arc-free high-current/high-voltage measurements all with safety in mind....
COMPASS 2020 – Keynote Highlight and Speaker Preview
...Engineer, FormFactor, Inc. At the conclusion of the speaker sessions there will be a moderated Q & A. For more information or to register for the online COMPASS conference, https://compass.formfactor.com/....