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Vertical Cavity Surface Emitting Laser – VCSEL Technology Takes Off!
...FormFactor FRT, these sensors automatically combine different information and thus generate new information that is not directly accessible. The software The tool is operated by the SEMI-compliant FormFactor FRT Acquire...
5G mmWave: Multi-site RF Probe Cards Enable Lower Cost-of-test in Mass Production
...through sequential-parallel testing. To realize actual cost reduction, tester and probe card companies need to evolve quickly to support increased parallelism of mmWave testing. This session drills down into the...
Global Locations
...advice on selecting the right probe or purchasing a new system, or you need to collaborate on a new probe card design for next-generation devices, you can contact us today....
New Technical Papers from IMS Now Available for Download
...strategies for conducting multi-wafer over-temperature testing, and included discussions on utilizing both commercial test executives and programming demonstrations utilizing FormFactor’s WinCal XE and Velox software, designed to automate on-wafer data...
Advanced Temperature Control for Semiconductor Wafer Test: On-Demand Workshop
Electrical test conditions are getting more and more extreme. Full wafer testing of DRAM, as example, are generating 2000 watts and more. AI chips, as well as the trend of...
PA200 BlueRay
Semi or fully-automated High-Accuracy Throughput The PA200 BlueRay™ enables high-throughput functional testing of optoelectronic (e.g. LED), MEMS (e.g. pressure sensors) and RF (e.g. SAW/BAW filters) devices. Its precision ensures smooth...
4 Challenges When Testing Si and Advanced GaN/ SiC Devices On-Wafer
...needed for these newer wide band gap devices. When testing Si and advanced GaN/ SiC devices on-wafer instead of in-package, R&D engineers and test operators are faced with some major...
VueTrack technology for unattended testing over multiple temperatures
FormFactor’s VueTrack technology, new on-site PTPA error correction method, dramatically increases the productivity of analytical probers in test labs, by enhancing contact reliability and automating PTPA error correction. The new...
5 Benefits of the EPS200MMW Dedicated Probe System
...both the novice and the expert user. Designed for upgradeability, the EPS200MMW system can be easily reconfigured to meet your future project requirements. Download the product data sheet here (PDF)....
High Throughput SiC Metrology and Inspection
...new product management department and eventually led him to the management level for FRT metrology products at FormFactor. Presentation Snapshot: Microchips made of silicon carbide (SiC) are currently driving a...
Upcoming Events – Quantum Australia and APS March Meeting
...Cryostats: FormFactor is the largest commercial dilution refrigerator supplier in the US. The HPD XLF-600 featuring the Aspect DR core and Frostbyte™ software, is designed for quantum computing research, development,...
Meeting the Challenges of 5G Production Test
...hardware and software components added to our newest probe systems, enabling true hands-free operation over multiple temperatures. With the Autonomous RF Assistant, an operator can start a test and leave...
Join Us: SEMI Pacific Northwest Breakfast Forum
...part of nearly every consumer device or product have created ramifications that include higher power density requirements, security concerns, and new data center strategies to support the growing demand. Join...
Boosting Quantum Computer Deployment with Dilution Refrigeration (DR) Systems
...and DC probe interface, enabling rapid test by eliminating days of wafer dicing and wire bonding Cryogenic Test Services at Advanced Cryogenic Lab located in Boulder, Colorado providing immediate access...
Experience the All New Velox 3 Probe Station Control Software
Windows 10 compatible – User-centered design – Efficient and robust. The all new Velox™ 3 is the first successfully completed step of our mission to make the world‘s most powerful...