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Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices
...industry’s highest test throughput, using Contact Intelligence™ with motorized probe positioners, enabling fully Autonomous DC and low frequency noise probing with multi-DUT layouts for complete hands-free 24/7 operation. Finally, the...
10 Features and Benefits of Autonomous DC Measurement Assistant – Post One
...automatic systems, offering complete hands-free 24/7 operation. The Autonomous DC Measurement Assistant combines motorized probe positioners with state-of-the-art image processing to achieve highly-reliable measurement data at any time. It enables...
Infinity Waveguide Probe
With the advent of Silicon CMOS and SiGe technologies, devices are getting smaller and faster. Test engineers need to validate the performance of their devices up to 500 GHz and...
Probe Positioners Brochure
.../ Device Characterization and Modeling / Ultra-low Noise Measurements (1/f) / RF, mm-Wave and Terahertz Measurements / High Power Test / Failure Analysis / Silicon Photonics Measurements / MEMS Test...
Cryogenic Probe Systems: The PLC50 Laboratory Probing Solution
...and specifications download the complete product data sheet for PLC50 (PDF). For non-cryogenic test requirements (e.g. for MEMS applications), the PLV50 vacuum probe system is available with an optional thermal...
10 Features and Benefits of Autonomous DC Measurement Assistant – Post Two
In our last blog post, we shared how FormFactor’s Autonomous DC Measurement Assistant represented a big change for engineers and lab managers, delivering a complete hands-free, 24/7 testing solution. The...
Autonomous RF Delivers Remote Probing from Anywhere
The ongoing COVID-19 pandemic has caused numerous challenges for nearly every business, including semiconductor testing and access to labs. That said, our Autonomous RF Measurement Assistant is designed to perform...
6 Reasons Why Probe Systems Service Agreements Make Sense
We have designed our Probe Systems Service Agreements to bring our customers simplicity and peace of mind when it comes to keeping equipment operating at optimum performance. We take the...
Production Testing of Silicon Photonics Wafers
...testing of Silicon Photonics wafers at the 33rd IEEE International Conference on Microelectronic Test Structures (ICMTS). In the paper, they discussed key wafer test challenges, including: Optimizing the test setup...
Delivering Advanced mm-Wave Load-Pull Measurements
...With 5G devices powering the vehicle to everything (V2X) market there is a need for EMI and light-tight testing at a wide temperature range, including tests down to -40°C without...
PROTEQ_RAYTHEON RF Seminar Registration
...8:30am -12:00pm RF Wafer Probing Seminar – 1:00pm – 4:30pm Location: Raytheon – Andover, MA Conigliaro Conference Room – Duke’s Building Download Event Information Register Today!...
PROTEQ_ANALOG RF Seminar Registration
...Probing Seminar – 1:00pm – 4:30pm Location: Analog Devices Wilmington Hub Hubble Conference Room Teams link to attend will be provided Download Event Information Register Today!...
PROTEQ_MACOM RF Seminar Registration
...Wafer Probing Seminar – 1:00pm – 4:30pm Location: MACOM Hale Street Building 121 Hale Street Lowell, MA 01851 (Engineering Conference Room) Download Event Information Register Today!...
The Impact of NRZ versus PAM4 on Wafer Test
...Pulse-Amplitude Modulation) on wafer test through example probe cards and describes the changing test requirements. The presentation covers all that is new with PAM4, including the timeline and why it’s...
Cryogenic Microwave Wafer-Scale Characterization of Superconducting Resonators
...comprehensive statistical dataset on resonator frequencies using a cutting-edge cryogenic wafer prober. Measurements were conducted using cryogenic RF probes and components to facilitate a two-port resonator assessment in reflection mode....