January 6, 2012Cascade Microtech to Present at the 14th Annual Needham Growth Conference
Beaverton, Ore. – (MARKET WIRE) – January 6, 2012 – Cascade Microtech Inc. (NASDAQ: CSCD), a premier semiconductor wafer test company, today announced that Michael Burger, Cascade Microtech’s President and CEO, and Jeff Killian, Cascade Microtech’s CFO, will present to the investment community attending the Needham Growth Conference at the New York Palace Hotel in New York on Wednesday, January 11, 2012 at 3:30 p.m. Eastern Time. This event will be webcast in listen-only mode. Listeners may log on at http://wsw.com/webcast/needham49/cscd/ and select "14th Annual Needham Growth Conference" in the “EVENTS” section to access the registration link. The webcast will remain available on the company's Web site for fourteen days.
About Cascade Microtech, Inc.
Cascade Microtech, Inc. (NASDAQ: CSCD) is a worldwide leader in precision contact, electrical measurement and test of integrated circuits (ICs), optical devices and other small structures. For technology businesses and scientific institutions that need to evaluate small structures, Cascade Microtech delivers access to electrical data from wafers, ICs, IC packages, circuit boards and modules, MEMS, 3D TSV, LED devices and more. Cascade Microtech’s leading-edge stations, probes, probe cards, advanced thermal subsystems and integrated systems deliver precision accuracy and superior performance both in the lab and during production manufacturing of high-speed and high-density semiconductor chips. For more information visit www.cascademicrotech.com.