EDGE: Fully Integrated Flicker Noise Measurement System
EDGE Delivering certified, accurate flicker noise measurements, from 1Hz to 30MHz
The EDGETM Flicker Noise Measurement System is the world's only integrated, noise-immune measurement system that certifies accurate flicker noise measurements from 1 Hz to 30 MHz. For the first time ever, R&D engineers, technicians and lab managers who need to measure flicker noise for device modeling or process development can enjoy extraordinarily simple access to flicker noise data over the widest frequency range, with the lowest background noise. Across the semiconductor industry, EDGE delivers new levels of certainty to companies that must continue to improve device performance, increase yield, command higher margins and reduce time to market.
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| Product Brochure | System Highlights | Datasheet |
