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Press Releases


Mar 3 2011 Cascade Microtech Partners With imec for 3D-TSV Probe Solutions

Cascade Microtech, Inc., a leading expert at enabling precision measurements of integrated circuits at the wafer level, and the nanoelectronics research center imec, today announced they have entered into a collaborative research partnership for testing and characterization of 3D integrated circuit (IC) test structures. Imec will work closely with Cascade Microtech to develop test methods and methodologies for emerging 3D Through-Silicon-Via (TSV) structures, and to lead the way in development of global standards for 3D IC development and production test. [View more]

Feb 17 2011 Technology Leader Cascade Microtech Finalist for Three Test Awards

Cascade Microtech, Inc. (NASDAQ: CSCD) today announced that its VueTrack™ probe-to-pad alignment solution and its S-Technology™ Pyramid production test probe cards have been selected by the editors of Test & Measurement World as finalists for "Best in Test" products in the category of Wafer Probing. The "Best in Test" awards are presented annually by Test & Measurement World to honor important and innovative new products and services in the electronics test and measurement industry. [View more]

Feb 9 2011 Cascade Microtech Reports Fourth Quarter and 2010 Results

BEAVERTON, Ore.—(MARKETWIRE)—February 9, 2011—Cascade Microtech, Inc. (NASDAQ:CSCD) today reported financial results for the fourth quarter and year ended December 31, 2010. [View more]

Jan 7 2011 Cascade Microtech to Present at the 13th Annual Needham Growth Conference

Cascade Microtech, Inc. (NASDAQ: CSCD) today announced that Michael Burger, Cascade Microtech’s president and CEO, and Jeff Killian, Cascade Microtech’s CFO, will present to the investment community attending the Needham Growth Conference at the New York Palace Hotel in New York on Wednesday, January 12, 2011 at 9:20 a.m. Eastern Time. [View more]

Nov 8 2010 Cascade Microtech Welcomes Steve Mahon as Vice President of Operations

Cascade Microtech, Inc. (NASDAQ: CSCD), a global leader in microelectronic test, today announced the appointment of Steve Mahon as vice president of operations. [View more]

Nov 2 2010 Cascade Microtech Reports Third Quarter 2010 Results

Cascade Microtech (NASDAQ:CSCD) today reported financial results for the third quarter ended September 30, 2010. [View more]

Oct 28 2010 Cascade Microtech to Discuss Latest Breakthroughs in 3D Device Test Technologies at Fall Test Conferences

Experts to present at the International Known-Good Die Conference, the International Test Conference, and the IEEE 3-D Test Workshop in Austin, Texas. [View more]

Oct 19 2010 Cascade Microtech To Announce Third Quarter Results On November 2, 2010

Cascade Microtech, Inc. will release financial results for its third quarter ended September 30, 2010, at approximately 4 p.m. EDT, on Tuesday, November 2, 2010. The company will host a conference call beginning at 5 p.m. EDT (2 p.m. PDT) that same afternoon to discuss these results. [View more]

Oct 7 2010 Cascade Microtech Reduces Cost-of-Ownership and Delivers Probing Expertise

Cascade Microtech, Inc. (NASDAQ: CSCD) today announced new programs to drive down ownership costs and provide customers with increased access to experts in probe technology. In a global response to market requirements to reduce the cost-of-ownership while at the same time meeting the ever-demanding complex probing challenges, Cascade Microtech is implementing three new programs. [View more]

Sep 28 2010 Cascade Microtech Improves Yield of Multi-site RF Production Test with New S-Technology Pyramid Probe Cards

Cascade Microtech, Inc. (NASDAQ: CSCD), a global supplier of production probe cards with industry-leading signal integrity for multi-site die testing, today announced S-Technology™ for improved contact physics. S-Technology provides a unique mechanical architecture for Pyramid Probe® cards designed to consistently deliver evenly distributed contact force for solder bump technologies found in today’s demanding high-volume production test environments. [View more]