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May 5 2011 Cascade Microtech Introduces New Viper Probe Card for High-Volume Test of Wafer-Level Chip-Scale Packages

Cascade Microtech, Inc. (NASDAQ: CSCD), a leading expert at precision measurements at the wafer level, today announced the first in the series of Viper™ probe cards. Viper probe cards will be used for test of high-volume production wafer-level chip-scale packaged devices (WLCSP). [View more]

May 4 2011 Cascade Microtech Reports First Quarter 2011 Results

First Quarter Revenue of $27.8 Million EPS $0.01 [View more]

Apr 21 2011 CASCADE MICROTECH TO ANNOUNCE FIRST QUARTER RESULTS ON MAY 4, 2011

Cascade Microtech, Inc. (NASDAQ:CSCD - News) will release financial results for its first quarter ended March 31, 2011, at approximately 4 p.m. EDT, on Wednesday, May 4, 2011. [View more]

Apr 7 2011 Cascade Microtech's BlueRay DS Probe System Wins Compound Semiconductor Award

CS Industry Awards Winner

Cascade Microtech, Inc. (NASDAQ: CSCD), a leading expert at enabling precision measurements of integrated circuits at the wafer level, today announced that their BlueRay™ DS Probe system won Compound Semiconductor magazine’s Metrology, Test and Measurement Award during a presentation at the Compound Semiconductor Europe Conference held in Frankfurt, Germany on March 22, 2011. [View more]

Mar 16 2011 Cascade Microtech Japan - Status After Tohoku Earthquake

この度の東北地方太平洋沖地震により被災された皆様に心よりお見舞い申し上げます。弊社の営業体制につきましてはこちらをご参照ください。 Cascade Microtech, Inc. would like to express its condolences to the victims in Tohoku Earthquake. Cascade Microtech’s sales and service office in Tokyo is not impacted by the earthquake and has resumed normal operations. [View more]

Mar 3 2011 Cascade Microtech Partners With imec for 3D-TSV Probe Solutions

Cascade Microtech, Inc., a leading expert at enabling precision measurements of integrated circuits at the wafer level, and the nanoelectronics research center imec, today announced they have entered into a collaborative research partnership for testing and characterization of 3D integrated circuit (IC) test structures. Imec will work closely with Cascade Microtech to develop test methods and methodologies for emerging 3D Through-Silicon-Via (TSV) structures, and to lead the way in development of global standards for 3D IC development and production test. [View more]

Feb 17 2011 Technology Leader Cascade Microtech Finalist for Three Test Awards

Cascade Microtech, Inc. (NASDAQ: CSCD) today announced that its VueTrack™ probe-to-pad alignment solution and its S-Technology™ Pyramid production test probe cards have been selected by the editors of Test & Measurement World as finalists for "Best in Test" products in the category of Wafer Probing. The "Best in Test" awards are presented annually by Test & Measurement World to honor important and innovative new products and services in the electronics test and measurement industry. [View more]

Feb 9 2011 Cascade Microtech Reports Fourth Quarter and 2010 Results

BEAVERTON, Ore.—(MARKETWIRE)—February 9, 2011—Cascade Microtech, Inc. (NASDAQ:CSCD) today reported financial results for the fourth quarter and year ended December 31, 2010. [View more]

Jan 7 2011 Cascade Microtech to Present at the 13th Annual Needham Growth Conference

Cascade Microtech, Inc. (NASDAQ: CSCD) today announced that Michael Burger, Cascade Microtech’s president and CEO, and Jeff Killian, Cascade Microtech’s CFO, will present to the investment community attending the Needham Growth Conference at the New York Palace Hotel in New York on Wednesday, January 12, 2011 at 9:20 a.m. Eastern Time. [View more]

Nov 8 2010 Cascade Microtech Welcomes Steve Mahon as Vice President of Operations

Cascade Microtech, Inc. (NASDAQ: CSCD), a global leader in microelectronic test, today announced the appointment of Steve Mahon as vice president of operations. [View more]