800-550-3279 ::  503-601-1000  ::  Contact Us  ::  Log On  ::  日本語

Press Releases

Company

Jun 16 2011 Cascade Microtech Integrated Probe Systems Speed Time-to-Market for Growing Power Device Segment

Cascade Microtech, Inc. (NASDAQ: CSCD), a leading expert at enabling precision measurements of integrated circuits at the wafer level, today announced that Iwatsu Test Instruments Corporation will manufacture CT-3100/3200 Curve Tracers exclusively for Cascade Microtech to provide versatile wafer-level measurement for the growing power device market. [View more]

May 19 2011 Cascade Microtech Adds New Features to WinCalXE Calibration Software

Cascade Microtech, Inc. (NASDAQ: CSCD), a leading expert at enabling precision measurements of integrated circuits at the wafer level, today announced the release of WinCalXE™ version 4.5 calibration software. WinCalXE 4.5 is a valuable tool for semiconductor engineering and production managers and engineers making on-wafer high-frequency measurements using a Vector Network Analyzer. WinCalXE 4.5 provides accurate, repeatable and precise S-parameter data critical to accurate device characterization. WinCalXE 4.5 improves the quality of models and processes resulting in higher device performance and reduced time-to-market. [View more]

May 19 2011 Cascade Microtech Appoints John (J.D.) Delafield to Board of Directors

Cascade Microtech, Inc. (NASDAQ: CSCD), a leading expert at precision measurements at the wafer level, today announced it has elected John (J.D.) Delafield, Jr. to its Board of Directors effective May 13, 2011. “Mr. Delafield brings a significant knowledge of capital markets to our Board of Directors. J.D.’s addition will provide a perspective into technology-driven investments and an international viewpoint that will benefit our management team as we drive [View more]

May 5 2011 Cascade Microtech Introduces New Viper Probe Card for High-Volume Test of Wafer-Level Chip-Scale Packages

Cascade Microtech, Inc. (NASDAQ: CSCD), a leading expert at precision measurements at the wafer level, today announced the first in the series of Viper™ probe cards. Viper probe cards will be used for test of high-volume production wafer-level chip-scale packaged devices (WLCSP). [View more]

May 4 2011 Cascade Microtech Reports First Quarter 2011 Results

First Quarter Revenue of $27.8 Million EPS $0.01 [View more]

Apr 21 2011 CASCADE MICROTECH TO ANNOUNCE FIRST QUARTER RESULTS ON MAY 4, 2011

Cascade Microtech, Inc. (NASDAQ:CSCD - News) will release financial results for its first quarter ended March 31, 2011, at approximately 4 p.m. EDT, on Wednesday, May 4, 2011. [View more]

Apr 7 2011 Cascade Microtech's BlueRay DS Probe System Wins Compound Semiconductor Award

CS Industry Awards Winner

Cascade Microtech, Inc. (NASDAQ: CSCD), a leading expert at enabling precision measurements of integrated circuits at the wafer level, today announced that their BlueRay™ DS Probe system won Compound Semiconductor magazine’s Metrology, Test and Measurement Award during a presentation at the Compound Semiconductor Europe Conference held in Frankfurt, Germany on March 22, 2011. [View more]

Mar 16 2011 Cascade Microtech Japan - Status After Tohoku Earthquake

この度の東北地方太平洋沖地震により被災された皆様に心よりお見舞い申し上げます。弊社の営業体制につきましてはこちらをご参照ください。 Cascade Microtech, Inc. would like to express its condolences to the victims in Tohoku Earthquake. Cascade Microtech’s sales and service office in Tokyo is not impacted by the earthquake and has resumed normal operations. [View more]

Mar 3 2011 Cascade Microtech Partners With imec for 3D-TSV Probe Solutions

Cascade Microtech, Inc., a leading expert at enabling precision measurements of integrated circuits at the wafer level, and the nanoelectronics research center imec, today announced they have entered into a collaborative research partnership for testing and characterization of 3D integrated circuit (IC) test structures. Imec will work closely with Cascade Microtech to develop test methods and methodologies for emerging 3D Through-Silicon-Via (TSV) structures, and to lead the way in development of global standards for 3D IC development and production test. [View more]

Feb 17 2011 Technology Leader Cascade Microtech Finalist for Three Test Awards

Cascade Microtech, Inc. (NASDAQ: CSCD) today announced that its VueTrack™ probe-to-pad alignment solution and its S-Technology™ Pyramid production test probe cards have been selected by the editors of Test & Measurement World as finalists for "Best in Test" products in the category of Wafer Probing. The "Best in Test" awards are presented annually by Test & Measurement World to honor important and innovative new products and services in the electronics test and measurement industry. [View more]