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Oct 7 1998 Cascade Microtech receives funding to develop Next-Generation Probe Cards for parallel testing
It was announced today that Cascade Microtech, Inc. is a recipient of a National Institute of Standards and Technology (NIST) Advanced Technology Program (ATP) award. Cascade Microtech will design and demonstrate large-area membrane probes for parallel testing of integrated circuits (ICs), arrays of chip-scale packages (CSPs) and high-density interconnect substrates (HDISs). The probes will substantially reduce the cost of test while enhancing the high-frequency capabilities of parallel testing and increasing product yields. [View more]
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Cascade Microtech, Inc.