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Conferences and Events


October 7, 2014 - October 9, 2014

European Microwave Week (EuMW)

Visit Cascade Microtech (Hall 9, Stand 101C) at EUMW 2014, to see the following on-wafer solutions:

MeasureOne™ THz Device Characterization Solution

  • Fully-integrated semi-automated on-wafer THz probing system for accurate characterization and calibration up to 1.1 THz
  • T-Wave™ probes deliver low insertion loss and excellent tip visibility, enabling accurate wafer-level device characterization

Wafer-Level Measurement Solution for mmW Device Characterization

  • Application-focused EPS200MMW probing package for mmW and load pull applications, delivering everything you need to achieve accurate measurement results
  • SIGMA options seamlessly integrate mmW heads and load pull tuners from major suppliers (Keysight, Maury, VDI and more), enabling the highest dynamic range and directivity

Location:Rome, Italy

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